Towards Deep Industrial Transfer Learning for Anomaly Detection on Time Series Data

Benjamin Maschler, Tim Knodel, Michael Weyrich

Deep learning promises performant anomaly detection on time-variant datasets, but greatly suffers from low availability of suitable training datasets and frequently changing tasks. Deep transfer learning offers mitigation by letting algorithms built upon previous knowledge from different tasks or locations. In this article, a modular deep learning algorithm for anomaly detection on time series datasets is presented that allows for an easy integration of such transfer learning capabilities. It is thoroughly tested on a dataset from a discrete manufacturing process in order to prove its fundamental adequacy towards deep industrial transfer learning - the transfer of knowledge in industrial applications' special environment.

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